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LA-ICP-MS is a technique capable of analyzing a large number of elements simultaneously at the ppm/ppb range. Solids are analysed using a laser ablation microscope, which can produce spots or lines in the sample down to about 10 um. This offers spatial resolution slightly worse than an SEM or Electron Microprobe but detection limits many orders of magnitude lower. Because of the use of a mass spectrometer, possible interferences are much more readily detected by checking isotopic ratios.

The Department is equipped with two Laser ICP-MS systems

• • Agilent 7900 ICP-MS connected to a New Wave (ESI) 193 nm excimer Laser Ablation Microscope.
  • Thermo Elemental (VG) PlasmaQuad PQ ExCell ICP-MS coupled to a New-Wave UP-213 Solid State Laser Ablation Microscope.

The Agilent/Excimer Laser system has significantly higher sensitivity then the Thermo/Solid State Laser system but is both more expensive and entails significantly more training to use.

In order to get a quantitative elemental analysis, usually the concentration of one element has to be analysed by another method, typically by electron microprobe analysis which is also available in the Department.

To arrange bookings, contact Colin Bray at cjbray@es.utoronto.ca or 416-978-6516